Scanning electron microscopy
CamScan MV2300
This scanning electron microscope is equipped with a standard W filament. It is used for secondary electron (SE) and backscatter electron (BSE) imaging, as well as for panchromatic cathodoluminescence (CL) acquisition. In-situ chemical analyses are performed using an energy dispersive X-ray spectrometer (EDS) (Oxford Instruments). An SEM microcomputed tomography (SEM μCT) device (SkyScan) is also installed on that microscope.
Tescan Mira LMU
This instrument is equipped with a Shottky field emission gun (FEG), and is used for secondary electron (SE) and backscatter electron (BSE) imaging. An energy dispersive X-ray spectrometer (EDS) (Oxford Instruments) enables in-situ chemical analyses. The microscope is also equipped with an electron backscatter diffraction (EBSD) camera (HKL Nordlys).
For bookings, new users are invited to fill in the SEM booking form and to read the guideline for users. Experienced users might prefer to email the contact person directly.
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