Scanning electron microscopy
This scanning electron microscope is equipped with a standard W filament. It is used for secondary electron (SE) and backscatter electron (BSE) imaging, as well as for panchromatic cathodoluminescence (CL) acquisition. In-situ chemical analyses are performed using an energy dispersive X-ray spectrometer (EDS) (Oxford Instruments). An SEM microcomputed tomography (SEM μCT) device (SkyScan) is also installed on that microscope.
This instrument is equipped with a Shottky field emission gun (FEG), and is used for secondary electron (SE) and backscatter electron (BSE) imaging. An energy dispersive X-ray spectrometer (EDS) (Oxford Instruments) enables in-situ chemical analyses. The microscope is also equipped with an electron backscatter diffraction (EBSD) camera (HKL Nordlys).
The schedule for the CamScan MV2300 SEM can be checked here. For the Tescan Mira LMU SEM, click here. For bookings, users are invited to email the contact person directly. New users are also encouraged to read the guideline for users.