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You are hereUNIL > Institute of Earth Sciences > Laboratories > Scanning electron microscopy

Scanning electron microscopy

CamScan MV2300Availability CamScan MV2300

This scanning electron microscope is equipped with a standard W filament. It is used for secondary electron (SE) and backscatter electron (BSE) imaging, as well as for panchromatic cathodoluminescence (CL) acquisition. In-situ chemical analyses are performed using an energy dispersive X-ray spectrometer (EDS) (Oxford Instruments). An SEM microcomputed tomography (SEM μCT) device (SkyScan) is also installed on that microscope.


Tescan Mira LMUAvailability Tescan Mira LMU

This instrument is equipped with a Shottky field emission gun (FEG), and is used for secondary electron (SE) and backscatter electron (BSE) imaging. An energy dispersive X-ray spectrometer (EDS) (Oxford Instruments) enables in-situ chemical analyses. The microscope is also equipped with an electron backscatter diffraction (EBSD) camera (HKL Nordlys).


The schedule for the CamScan MV2300 SEM can be checked here. For the Tescan Mira LMU SEM, click here. For bookings,  users are invited to email the contact person directly. New users are also encouraged to read the guideline for users.



Lab: 0518
Tel: +41 21 692 43 53

Contact: Pierre Vonlanthen
Tel: +41 21 692 35 24

GĂ©opolis - CH-1015 Lausanne  - Switzerland  -  Tel. +41 21 692 43 06  -  Fax +41 21 692 43 05
Swiss University