X-ray fluorescence

PANalytical Axios^mAX

X-ray florescence spectrometry is used to identify and quantify the chemical elements present in solid, powdered and liquid samples. XRF is capable of measuring elements from fluorine to uranium, and in concentrations from ppm level up to 100 wt%.

The XRF facility houses a wavelength dispersive X-ray fluorescence spectrometer PANalytical Axios^mAX fitted with a 4,0 KW Rh X-ray tube. It is set up to analyse a wide range of major and trace elements in geological and environmental materials.

Routine analyses of major elements (SiO₂, TiO₂, Al₂O₃, Fe₂O₃, MnO, MgO, CaO, Na₂O, K₂O, P₂O₅, Cr₂O₃, NiO) are performed on fused-disks prepared from 1.2 g of calcined sample powder mixed with Lithium-Tetraborat. Calibrations based on certified international standards are available for high-SiO₂ and low-SiO₂ rocks, carbonate rocks, phosphate rocks, as well as Mn- and Fe-rich materials.

Routine trace elements analyses (Sc, V, Cr, Mn, Co, Ni, Cu, Zn, Ga, Ge, As, Se, Br, Rb, Sr, Y, Zr, Nb, Mo, Ag, Cd, Sn, Sb, Te, I, Cs, Ba, La, Ce, Nd, Sm, Yb, Hf, Ta, W, Hg, Tl, Pb, Bi, Th, U) are conducted on disks obtained by pressing 12 g of sample powder on a support of Hoechst-wax-C. The limits of detection depend on the element concerned and the matrix but are typically in the range 1 to 7 ppm.

Check the schedule for the PANalytical Axios^mAX